Figure Open Access
Engelmann, Hans-Jürgen
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"description": "<p>Energy-filtered transmission electron microscopy (EFTEM) images of stacked Si/SiO2/Si nanopillars</p>",
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"name": "Sub-20 nm multilayer nanopillar patterning for hybrid SET/CMOS integration: Figs. 1a, 1b and 5",
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