Figure Open Access
Engelmann, Hans-Jürgen
{ "description": "<p>Energy-filtered transmission electron microscopy (EFTEM) images of stacked Si/SiO2/Si nanopillars</p>", "license": "https://creativecommons.org/licenses/by/4.0/legalcode", "@id": "https://doi.org/10.14278/rodare.807", "sameAs": [ "https://www.hzdr.de/publications/Publ-32276" ], "identifier": "https://doi.org/10.14278/rodare.807", "datePublished": "2021-02-09", "@context": "https://schema.org/", "url": "https://rodare.hzdr.de/record/807", "@type": "ImageObject", "creator": [ { "name": "Engelmann, Hans-J\u00fcrgen", "affiliation": "HZDR", "@type": "Person" } ], "name": "Sub-20 nm multilayer nanopillar patterning for hybrid SET/CMOS integration: Figs. 1a, 1b and 5", "contributor": [ { "name": "von Borany, Johannes", "affiliation": "HZDR", "@type": "Person" } ] }
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