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HIM and AFM Data set from first AFM in the HIM test

Hlawacek, Gregor; Andany, Santiago

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@misc{hlawacek_gregor_2020_250,
  author       = {Hlawacek, Gregor and
                  Andany, Santiago},
  title        = {{HIM and AFM Data set from first AFM in the HIM 
                   test}},
  month        = feb,
  year         = 2020,
  doi          = {10.14278/rodare.250},
  url          = {https://doi.org/10.14278/rodare.250}
}
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Publication date:
February 4, 2020
DOI:
10.14278/rodare.250

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10.14278/rodare.250

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Keyword(s):
Helium Ion Microscopy Atomic Force Microscopy
Grants:
European Commission:
  • IONS4SET - Ion-irradiation-induced Si Nanodot Self-Assembly for Hybrid SET-CMOS Technology (688072)
Related identifiers:
Identical to:
https://www.hzdr.de/publications/Publ-30718
Referenced by:
https://www.hzdr.de/publications/Publ-30689
Communities:

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Version 1 10.14278/rodare.250 Feb 4, 2020
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