Dataset Open Access
Ratschinski, I.;
Nagarajan, S.;
Trommer, J.;
Luferau, Andrei;
Khan, M. B.;
Erbe, Artur;
Georgiev, Yordan;
Mikolajick, T.;
Smith, S. C.;
König, D.;
Hiller, D.
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"description": "<p>Measured resistance as a function of nanowire (NW) width for different modulation doped Si NWs.</p>",
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