Dataset Open Access
Ratschinski, I.; Nagarajan, S.; Trommer, J.; Luferau, Andrei; Khan, M. B.; Erbe, Artur; Georgiev, Yordan; Mikolajick, T.; Smith, S. C.; König, D.; Hiller, D.
Measured resistance as a function of nanowire (NW) width for different modulation doped Si NWs.
Name | Size | |
---|---|---|
1.jpg
md5:fd3b8649423c2922d27033c629d8d8a5 |
478.7 kB | Download |
2.jpg
md5:c7225a8fd1a7a985d1771399546163a0 |
588.8 kB | Download |
3.jpg
md5:f311a0345176aca49b20b941aca80585 |
626.2 kB | Download |
4.jpg
md5:6483f56aac0c53138d22841f0d3dd78a |
659.8 kB | Download |
5.jpg
md5:b3a653baff915b0b8e8d2c36dc520aa7 |
639.2 kB | Download |
6.jpg
md5:c24c784e95e8c031d26b1d5ba0cb9dd0 |
710.6 kB | Download |
7.jpg
md5:8307385a425fd26302da851d656ac25d |
840.9 kB | Download |
Comparison.jpg
md5:342003686a5aea92f0e2772c2de8e713 |
854.8 kB | Download |
Comparison.opj
md5:d4b921227215f843f8d8d1a3a621613d |
143.2 kB | Download |
Comparison.xlsx
md5:daa564fe862c4ef3e4ad50ed733595d3 |
16.4 kB | Download |
E9_50V_Device2_array.opj
md5:af5f9be5fd0c1f04eec1681ac483e76f |
253.1 kB | Download |
R to thickness.jpg
md5:3163a50b10d6e23cf196dbdc75ccb505 |
1.7 MB | Download |
Resistance to tickness 2.opj
md5:45727def90d387a34eb3feca4e6b5bee |
326.4 kB | Download |
Resistance to tickness.opj
md5:cd57b6f955de11fa17fe9e3c33e91ed4 |
76.3 kB | Download |
All versions | This version | |
---|---|---|
Views | 215 | 215 |
Downloads | 304 | 304 |
Data volume | 146.5 MB | 146.5 MB |
Unique views | 170 | 170 |
Unique downloads | 113 | 113 |