Dataset Open Access
Ratschinski, I.;
Nagarajan, S.;
Trommer, J.;
Luferau, Andrei;
Khan, M. B.;
Erbe, Artur;
Georgiev, Yordan;
Mikolajick, T.;
Smith, S. C.;
König, D.;
Hiller, D.
Measured resistance as a function of nanowire (NW) width for different modulation doped Si NWs.
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Comparison.opj
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Comparison.xlsx
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E9_50V_Device2_array.opj
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R to thickness.jpg
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Resistance to tickness 2.opj
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Resistance to tickness.opj
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Ratschinski, I., Nagarajan, S., Trommer, J., Luferau, Andrei, Khan, M. B., Erbe, Artur, … Hiller, D. (2024). Data publication: Significant Resistance Reduction in Modulation-Doped Silicon Nanowires via Aluminum-Induced Acceptor States in SiO2 [Data set]. Rodare. http://doi.org/10.14278/rodare.2716