Dataset Open Access
Data to Impact on various cleaning procedures on p-GaN surfaces
Schaber, Jana;
Xiang, Rong;
Arnold, André;
Ryzhov, Anton;
Teichert, Jochen;
Murcek, Petr;
Zwartek, Paul;
Ma, Shuai;
Michel, Peter
This folder "XPS data" contains original and evaluated XPS data (.vms) on a p-GaN sample which was treated at various temperatures and underwent Ar+ irradiation.
Furthermore, the folder "REM Images" contains REM images (.tif) and EDX data (.xlsx) on the used excessively treated sample.
All images that are published in the main manuscript are collected as .tif files in the folder "images".
Files
(7.4 MB)
| Name | Size | |
|---|---|---|
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Dataset on Impact of various cleaning procedures on p-GaN surfaces.zip
md5:ca7b46edf1aea501a23db69ad0986c9d |
7.4 MB | Download |
279
17
views
downloads
| All versions | This version | |
|---|---|---|
| Views | 279 | 279 |
| Downloads | 17 | 17 |
| Data volume | 125.7 MB | 125.7 MB |
| Unique views | 221 | 221 |
| Unique downloads | 16 | 16 |
- Publication date:
- February 23, 2023
- DOI:
-
- Keyword(s):
- damage effects sputtering damage surface cleaning p-GaN photocathode
- Related identifiers:
- Cites:
10.17815/jlsrf-2-58, 10.17815/jlsrf-3-159 - Identical to:
https://www.hzdr.de/publications/Publ-36606 - Referenced by:
10.1002/sia.7207, https://www.hzdr.de/publications/Publ-36534 - Communities:
- License (for files):
- Creative Commons Attribution 4.0 International