February 23, 2023 Dataset Open Access

Schaber, Jana; Xiang, Rong; Arnold, André; Ryzhov, Anton; Teichert, Jochen; Murcek, Petr; Zwartek, Paul; Ma, Shuai; Michel, Peter

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{
  "creator": [
    {
      "@type": "Person", 
      "@id": "https://orcid.org/0000-0002-1848-8054", 
      "name": "Schaber, Jana"
    }, 
    {
      "@type": "Person", 
      "@id": "https://orcid.org/0000-0002-0106-5231", 
      "name": "Xiang, Rong"
    }, 
    {
      "@type": "Person", 
      "@id": "https://orcid.org/0000-0003-1046-635X", 
      "name": "Arnold, Andr\u00e9"
    }, 
    {
      "@type": "Person", 
      "@id": "https://orcid.org/0000-0002-4965-4027", 
      "name": "Ryzhov, Anton"
    }, 
    {
      "@type": "Person", 
      "name": "Teichert, Jochen"
    }, 
    {
      "@type": "Person", 
      "name": "Murcek, Petr"
    }, 
    {
      "@type": "Person", 
      "name": "Zwartek, Paul"
    }, 
    {
      "@type": "Person", 
      "@id": "https://orcid.org/0000-0002-1132-8322", 
      "name": "Ma, Shuai"
    }, 
    {
      "@type": "Person", 
      "@id": "https://orcid.org/0000-0001-6187-9440", 
      "name": "Michel, Peter"
    }
  ], 
  "@context": "https://schema.org/", 
  "distribution": [
    {
      "@type": "DataDownload", 
      "fileFormat": "zip", 
      "contentUrl": "https://rodare.hzdr.de/api/files/96f3eed0-34ae-4626-acdd-fea86023f437/Dataset on Impact of various cleaning procedures on p-GaN surfaces.zip"
    }
  ], 
  "sameAs": [
    "https://www.hzdr.de/publications/Publ-36606"
  ], 
  "datePublished": "2023-02-23", 
  "name": "Data to Impact on various cleaning procedures on p-GaN surfaces", 
  "identifier": "https://doi.org/10.14278/rodare.2168", 
  "keywords": [
    "damage effects", 
    "sputtering damage", 
    "surface cleaning", 
    "p-GaN", 
    "photocathode"
  ], 
  "license": "https://creativecommons.org/licenses/by/4.0/legalcode", 
  "url": "https://rodare.hzdr.de/record/2168", 
  "@id": "https://doi.org/10.14278/rodare.2168", 
  "@type": "Dataset", 
  "citation": [
    {
      "@type": "CreativeWork", 
      "@id": "https://doi.org/10.17815/jlsrf-2-58"
    }, 
    {
      "@type": "CreativeWork", 
      "@id": "https://doi.org/10.17815/jlsrf-3-159"
    }
  ], 
  "description": "<p>This folder &quot;XPS data&quot; contains original and evaluated XPS data (.vms) on a p-GaN sample which was treated at various temperatures and underwent Ar+ irradiation.</p>\n\n<p>Furthermore, the folder &quot;REM Images&quot; contains REM images (.tif) and EDX data (.xlsx) on the used excessively treated sample.</p>\n\n<p>All images that are published in the main manuscript are collected as .tif files in the folder &quot;images&quot;.</p>"
}