February 23, 2023 Dataset Open Access

Schaber, Jana; Xiang, Rong; Arnold, André; Ryzhov, Anton; Teichert, Jochen; Murcek, Petr; Zwartek, Paul; Ma, Shuai; Michel, Peter

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{
  "type": "dataset", 
  "abstract": "<p>This folder &quot;XPS data&quot; contains original and evaluated XPS data (.vms) on a p-GaN sample which was treated at various temperatures and underwent Ar+ irradiation.</p>\n\n<p>Furthermore, the folder &quot;REM Images&quot; contains REM images (.tif) and EDX data (.xlsx) on the used excessively treated sample.</p>\n\n<p>All images that are published in the main manuscript are collected as .tif files in the folder &quot;images&quot;.</p>", 
  "author": [
    {
      "family": "Schaber, Jana"
    }, 
    {
      "family": "Xiang, Rong"
    }, 
    {
      "family": "Arnold, Andr\u00e9"
    }, 
    {
      "family": "Ryzhov, Anton"
    }, 
    {
      "family": "Teichert, Jochen"
    }, 
    {
      "family": "Murcek, Petr"
    }, 
    {
      "family": "Zwartek, Paul"
    }, 
    {
      "family": "Ma, Shuai"
    }, 
    {
      "family": "Michel, Peter"
    }
  ], 
  "DOI": "10.14278/rodare.2168", 
  "issued": {
    "date-parts": [
      [
        2023, 
        2, 
        23
      ]
    ]
  }, 
  "title": "Data to Impact on various cleaning procedures on p-GaN surfaces", 
  "id": "2168", 
  "publisher": "Rodare"
}