Dataset Open Access
Schaber, Jana;
Xiang, Rong;
Arnold, André;
Ryzhov, Anton;
Teichert, Jochen;
Murcek, Petr;
Zwartek, Paul;
Ma, Shuai;
Michel, Peter
{
"abstract": "<p>This folder "XPS data" contains original and evaluated XPS data (.vms) on a p-GaN sample which was treated at various temperatures and underwent Ar+ irradiation.</p>\n\n<p>Furthermore, the folder "REM Images" contains REM images (.tif) and EDX data (.xlsx) on the used excessively treated sample.</p>\n\n<p>All images that are published in the main manuscript are collected as .tif files in the folder "images".</p>",
"issued": {
"date-parts": [
[
2023,
2,
23
]
]
},
"author": [
{
"family": "Schaber, Jana"
},
{
"family": "Xiang, Rong"
},
{
"family": "Arnold, Andr\u00e9"
},
{
"family": "Ryzhov, Anton"
},
{
"family": "Teichert, Jochen"
},
{
"family": "Murcek, Petr"
},
{
"family": "Zwartek, Paul"
},
{
"family": "Ma, Shuai"
},
{
"family": "Michel, Peter"
}
],
"title": "Data to Impact on various cleaning procedures on p-GaN surfaces",
"DOI": "10.14278/rodare.2168",
"type": "dataset",
"id": "2168",
"publisher": "Rodare"
}
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