Dataset Restricted Access

Data publication: Structural changes in Ge1 xSnx and Si1-x-yGexSny thin films on SOI substrates treated by pulse laser annealing

Steuer, Oliver; Schwarz, Daniel; Oehme, Michael; Bärwolf, Florian; Cheng, Yu; Ganss, Fabian; Hübner, René; Heller, René; Zhou, Shengqiang; Helm, Manfred; Cuniberti, Gianaurelio; Georgiev, Yordan; Prucnal, Slawomir


Dublin Core Export

<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:creator>Steuer, Oliver</dc:creator>
  <dc:creator>Schwarz, Daniel</dc:creator>
  <dc:creator>Oehme, Michael</dc:creator>
  <dc:creator>Bärwolf, Florian</dc:creator>
  <dc:creator>Cheng, Yu</dc:creator>
  <dc:creator>Ganss, Fabian</dc:creator>
  <dc:creator>Hübner, René</dc:creator>
  <dc:creator>Heller, René</dc:creator>
  <dc:creator>Zhou, Shengqiang</dc:creator>
  <dc:creator>Helm, Manfred</dc:creator>
  <dc:creator>Cuniberti, Gianaurelio</dc:creator>
  <dc:creator>Georgiev, Yordan</dc:creator>
  <dc:creator>Prucnal, Slawomir</dc:creator>
  <dc:date>2024-08-14</dc:date>
  <dc:description>Messdaten für das Paper</dc:description>
  <dc:identifier>https://rodare.hzdr.de/record/3086</dc:identifier>
  <dc:identifier>10.14278/rodare.3086</dc:identifier>
  <dc:identifier>oai:rodare.hzdr.de:3086</dc:identifier>
  <dc:relation>doi:10.17815/jlsrf-3-159</dc:relation>
  <dc:relation>url:https://www.hzdr.de/publications/Publ-38905</dc:relation>
  <dc:relation>url:https://www.hzdr.de/publications/Publ-38902</dc:relation>
  <dc:relation>doi:10.14278/rodare.3085</dc:relation>
  <dc:relation>url:https://rodare.hzdr.de/communities/fwi</dc:relation>
  <dc:relation>url:https://rodare.hzdr.de/communities/ibc</dc:relation>
  <dc:relation>url:https://rodare.hzdr.de/communities/rodare</dc:relation>
  <dc:rights>info:eu-repo/semantics/restrictedAccess</dc:rights>
  <dc:title>Data publication: Structural changes in Ge1 xSnx and Si1-x-yGexSny thin films on SOI substrates treated by pulse laser annealing</dc:title>
  <dc:type>info:eu-repo/semantics/other</dc:type>
  <dc:type>dataset</dc:type>
</oai_dc:dc>
28
5
views
downloads
All versions This version
Views 2828
Downloads 55
Data volume 26.8 MB26.8 MB
Unique views 2424
Unique downloads 22

Share

Cite as