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Data publication: Structural changes in Ge1 xSnx and Si1-x-yGexSny thin films on SOI substrates treated by pulse laser annealing

Steuer, Oliver; Schwarz, Daniel; Oehme, Michael; Bärwolf, Florian; Cheng, Yu; Ganss, Fabian; Hübner, René; Heller, René; Zhou, Shengqiang; Helm, Manfred; Cuniberti, Gianaurelio; Georgiev, Yordan; Prucnal, Slawomir

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Publication date:
August 14, 2024
DOI:
10.14278/rodare.3086

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10.14278/rodare.3086

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Related identifiers:
Cites:
10.17815/jlsrf-3-159
Identical to:
https://www.hzdr.de/publications/Publ-38905
Referenced by:
https://www.hzdr.de/publications/Publ-38902
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Version 1 10.14278/rodare.3086 Aug 14, 2024
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