Dataset Open Access
Arora, Himani; Fekri, Zahra; Vekariya, Yagnika Nandlal; Chava, Phanish; Watanabe, Kenji; Taniguchi, Takashi; Helm, Manfred; Erbe, Artur
{ "type": "dataset", "issued": { "date-parts": [ [ 2022, 4, 29 ] ] }, "abstract": "<p>Fabricated devices went through electrical characterization with 4200-SCS parameter analyzer located in greyroom and Agilent 4156C Parameter Analyzer equipped with a cool-down setup located in 613. The measured data was processed with origin software.</p>", "id": "1552", "author": [ { "family": "Arora, Himani" }, { "family": "Fekri, Zahra" }, { "family": "Vekariya, Yagnika Nandlal" }, { "family": "Chava, Phanish" }, { "family": "Watanabe, Kenji" }, { "family": "Taniguchi, Takashi" }, { "family": "Helm, Manfred" }, { "family": "Erbe, Artur" } ], "DOI": "10.14278/rodare.1552", "title": "Data: Fully encapsulated and stable black phosphorus field-effect transistors", "publisher": "Rodare" }
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