Dataset Open Access
Arora, Himani; Fekri, Zahra; Vekariya, Yagnika Nandlal; Chava, Phanish; Watanabe, Kenji; Taniguchi, Takashi; Helm, Manfred; Erbe, Artur
Fabricated devices went through electrical characterization with 4200-SCS parameter analyzer located in greyroom and Agilent 4156C Parameter Analyzer equipped with a cool-down setup located in 613. The measured data was processed with origin software.
All versions | This version | |
---|---|---|
Views | 683 | 683 |
Downloads | 439 | 439 |
Data volume | 841.5 MB | 841.5 MB |
Unique views | 249 | 249 |
Unique downloads | 75 | 75 |