Dataset Open Access
Pruchnik, Bartosz;
Kwoka, Krzysztof;
Piasecki, Tomasz;
Sangiao, Soraya;
de Teresa, José M.;
Putek, Piotr;
Gacka, Ewelina;
Badura, Dominik;
Sierakowski, Andrzej;
Janus, Paweł;
Gotszalk, Teodor
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"Lab-in-SEM",
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"description": "<p>The data contains: </p>\n\n<p>- measurement of opMEMS bridge relative deflection, </p>\n\n<p>- effect of annealing, produced by the large currents used on the experiment, on resistance of PtC, Co and WC nanowires,</p>\n\n<p>- relative resistance change versus strain of FEBID (focused electron beam induced deposition) nanowires for three tested materials. </p>",
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| Data volume | 70.2 MB | 70.2 MB |
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| Unique downloads | 17 | 17 |