July 30, 2026 Dataset Open Access

Pruchnik, Bartosz; Kwoka, Krzysztof; Piasecki, Tomasz; Sangiao, Soraya; de Teresa, José M.; Putek, Piotr; Gacka, Ewelina; Badura, Dominik; Sierakowski, Andrzej; Janus, Paweł; Gotszalk, Teodor

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    "description": "<p>The data contains:&nbsp;</p>\n\n<p>- measurement of opMEMS bridge relative deflection,&nbsp;</p>\n\n<p>- effect of annealing, produced by the large currents used on the experiment, on resistance of PtC, Co and WC nanowires,</p>\n\n<p>- relative resistance change versus strain of FEBID (focused electron beam induced deposition) nanowires&nbsp;for three tested materials.&nbsp;</p>", 
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    "title": "Data publication: Measurement of piezoresistivity in self-standing nanowires fabricated by focused electron beam-induced deposition", 
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