July 30, 2026 Dataset Open Access

Pruchnik, Bartosz; Kwoka, Krzysztof; Piasecki, Tomasz; Sangiao, Soraya; de Teresa, José M.; Putek, Piotr; Gacka, Ewelina; Badura, Dominik; Sierakowski, Andrzej; Janus, Paweł; Gotszalk, Teodor

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{
  "author": [
    {
      "family": "Pruchnik, Bartosz"
    }, 
    {
      "family": "Kwoka, Krzysztof"
    }, 
    {
      "family": "Piasecki, Tomasz"
    }, 
    {
      "family": "Sangiao, Soraya"
    }, 
    {
      "family": "de Teresa, Jos\u00e9 M."
    }, 
    {
      "family": "Putek, Piotr"
    }, 
    {
      "family": "Gacka, Ewelina"
    }, 
    {
      "family": "Badura, Dominik"
    }, 
    {
      "family": "Sierakowski, Andrzej"
    }, 
    {
      "family": "Janus, Pawe\u0142"
    }, 
    {
      "family": "Gotszalk, Teodor"
    }
  ], 
  "issued": {
    "date-parts": [
      [
        2026, 
        7, 
        30
      ]
    ]
  }, 
  "id": "4892", 
  "title": "Data publication: Measurement of piezoresistivity in self-standing nanowires fabricated by focused electron beam-induced deposition", 
  "type": "dataset", 
  "DOI": "10.14278/rodare.4892", 
  "publisher": "Rodare", 
  "abstract": "<p>The data contains:&nbsp;</p>\n\n<p>- measurement of opMEMS bridge relative deflection,&nbsp;</p>\n\n<p>- effect of annealing, produced by the large currents used on the experiment, on resistance of PtC, Co and WC nanowires,</p>\n\n<p>- relative resistance change versus strain of FEBID (focused electron beam induced deposition) nanowires&nbsp;for three tested materials.&nbsp;</p>"
}