Dataset Open Access
Pruchnik, Bartosz;
Kwoka, Krzysztof;
Piasecki, Tomasz;
Sangiao, Soraya;
de Teresa, José M.;
Putek, Piotr;
Gacka, Ewelina;
Badura, Dominik;
Sierakowski, Andrzej;
Janus, Paweł;
Gotszalk, Teodor
The data contains:
- measurement of opMEMS bridge relative deflection,
- effect of annealing, produced by the large currents used on the experiment, on resistance of PtC, Co and WC nanowires,
- relative resistance change versus strain of FEBID (focused electron beam induced deposition) nanowires for three tested materials.
| Name | Size | |
|---|---|---|
|
giant_piezoresistivity_results.opju
md5:b275c45bde37ef60a25cb22953af294c |
5.3 MB | Download |
|
opMEMS_actuation_results.opju
md5:b7ac2ffbfa69a9913aa76999327d9718 |
3.0 MB | Download |
|
Pt_annealing.opju
md5:a1da35aae37e111e5f1402fb340e7769 |
6.1 MB | Download |
|
W_Co_annealing.opju
md5:60c756d2e3829148c944539fbecea7f5 |
1.2 MB | Download |
| All versions | This version | |
|---|---|---|
| Views | 34 | 34 |
| Downloads | 17 | 17 |
| Data volume | 70.2 MB | 70.2 MB |
| Unique views | 34 | 34 |
| Unique downloads | 17 | 17 |