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Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon

Gawne, Thomas Daniel; Moldabekov, Zhandos; Humphries, Oliver S.; Appel, Karen; Bähtz, Carsten; Bouffetier, Victorien; Brambrink, Erik; Cangi, Attila; Crepisson, Celine; Göde, Sebastian; Konopkova, Zuzana; Makita, Mikako; Mishchenko, Mikhail; Nakatsutsumi, Motoaki; Randolph, Lisa; Schwalbe, Sebastian; Vorberger, Jan; Zastrau, Ulf; Dornheim, Tobias; Preston, Thomas R.


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