Dataset Open Access

Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon

Gawne, Thomas Daniel; Moldabekov, Zhandos; Humphries, Oliver S.; Appel, Karen; Bähtz, Carsten; Bouffetier, Victorien; Brambrink, Erik; Cangi, Attila; Crepisson, Celine; Göde, Sebastian; Konopkova, Zuzana; Makita, Mikako; Mishchenko, Mikhail; Nakatsutsumi, Motoaki; Randolph, Lisa; Schwalbe, Sebastian; Vorberger, Jan; Zastrau, Ulf; Dornheim, Tobias; Preston, Thomas R.


BibTeX Export

@misc{gawne_thomas_daniel_2025_3650,
  author       = {Gawne, Thomas Daniel and
                  Moldabekov, Zhandos and
                  Humphries, Oliver S. and
                  Appel, Karen and
                  Bähtz, Carsten and
                  Bouffetier, Victorien and
                  Brambrink, Erik and
                  Cangi, Attila and
                  Crepisson, Celine and
                  Göde, Sebastian and
                  Konopkova, Zuzana and
                  Makita, Mikako and
                  Mishchenko, Mikhail and
                  Nakatsutsumi, Motoaki and
                  Randolph, Lisa and
                  Schwalbe, Sebastian and
                  Vorberger, Jan and
                  Zastrau, Ulf and
                  Dornheim, Tobias and
                  Preston, Thomas R.},
  title        = {{Strong geometry dependence of the x-ray Thomson 
                   scattering spectrum in single crystal silicon}},
  month        = mar,
  year         = 2025,
  doi          = {10.14278/rodare.3650},
  url          = {https://doi.org/10.14278/rodare.3650}
}
0
0
views
downloads
All versions This version
Views 00
Downloads 00
Data volume 0 Bytes0 Bytes
Unique views 00
Unique downloads 00

Share

Cite as