Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon

Gawne, Thomas Daniel; Moldabekov, Zhandos; Humphries, Oliver S.; Appel, Karen; Bähtz, Carsten; Bouffetier, Victorien; Brambrink, Erik; Cangi, Attila; Crepisson, Celine; Göde, Sebastian; Konopkova, Zuzana; Makita, Mikako; Mishchenko, Mikhail; Nakatsutsumi, Motoaki; Randolph, Lisa; Schwalbe, Sebastian; Vorberger, Jan; Zastrau, Ulf; Dornheim, Tobias; Preston, Thomas R.

doi:10.14278/rodare.3650

March 26, 2025 Dataset Open Access

Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon

Gawne, Thomas Daniel; Moldabekov, Zhandos; Humphries, Oliver S.; Appel, Karen; Bähtz, Carsten; Bouffetier, Victorien; Brambrink, Erik; Cangi, Attila; Crepisson, Celine; Göde, Sebastian; Konopkova, Zuzana; Makita, Mikako; Mishchenko, Mikhail; Nakatsutsumi, Motoaki; Randolph, Lisa; Schwalbe, Sebastian; Vorberger, Jan; Zastrau, Ulf; Dornheim, Tobias; Preston, Thomas R.

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      <creatorName>Zastrau, Ulf</creatorName>
      <givenName>Ulf</givenName>
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  <titles>
    <title>Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon</title>
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  <publisher>Rodare</publisher>
  <publicationYear>2025</publicationYear>
  <subjects>
    <subject>X-ray Thomson scattering</subject>
    <subject>Ultrahigh resolution</subject>
    <subject>X-ray free electron laser</subject>
    <subject>Density function theory</subject>
    <subject>Linear response TDDFT</subject>
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    <description descriptionType="Abstract">&lt;p&gt;Theory datasets from the article &amp;quot;Strong geometry dependence of the X-ray Thomson Scattering Spectrum in single crystal silicon&amp;quot;&lt;/p&gt;</description>
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March 26, 2025

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Keyword(s):

X-ray Thomson scattering Ultrahigh resolution X-ray free electron laser Density function theory Linear response TDDFT

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Creative Commons Attribution 4.0 International

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Gawne, Thomas Daniel, Moldabekov, Zhandos, Humphries, Oliver S., Appel, Karen, Bähtz, Carsten, Bouffetier, Victorien, … Preston, Thomas R. (2025). Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon [Data set]. Rodare. http://doi.org/10.14278/rodare.3650

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Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon

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