Dataset Open Access
Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon
Gawne, Thomas Daniel;
Moldabekov, Zhandos;
Humphries, Oliver S.;
Appel, Karen;
Bähtz, Carsten;
Bouffetier, Victorien;
Brambrink, Erik;
Cangi, Attila;
Crepisson, Celine;
Göde, Sebastian;
Konopkova, Zuzana;
Makita, Mikako;
Mishchenko, Mikhail;
Nakatsutsumi, Motoaki;
Randolph, Lisa;
Schwalbe, Sebastian;
Vorberger, Jan;
Zastrau, Ulf;
Dornheim, Tobias;
Preston, Thomas R.
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- Publication date:
- March 26, 2025
- DOI:
-
- Keyword(s):
- X-ray Thomson scattering Ultrahigh resolution X-ray free electron laser Density function theory Linear response TDDFT
- Related identifiers:
- Identical to:
https://www.hzdr.de/publications/Publ-41145 - Communities:
- License (for files):
- Creative Commons Attribution 4.0 International
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Cite as
Gawne, Thomas Daniel, Moldabekov, Zhandos, Humphries, Oliver S., Appel, Karen, Bähtz, Carsten, Bouffetier, Victorien, … Preston, Thomas R. (2025). Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon [Data set]. Rodare. http://doi.org/10.14278/rodare.3650
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