Dataset Open Access

Strong geometry dependence of the x-ray Thomson scattering spectrum in single crystal silicon

Gawne, Thomas Daniel; Moldabekov, Zhandos; Humphries, Oliver S.; Appel, Karen; Bähtz, Carsten; Bouffetier, Victorien; Brambrink, Erik; Cangi, Attila; Crepisson, Celine; Göde, Sebastian; Konopkova, Zuzana; Makita, Mikako; Mishchenko, Mikhail; Nakatsutsumi, Motoaki; Randolph, Lisa; Schwalbe, Sebastian; Vorberger, Jan; Zastrau, Ulf; Dornheim, Tobias; Preston, Thomas R.

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Publication date:
March 26, 2025
DOI:
10.14278/rodare.3650

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10.14278/rodare.3650

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Keyword(s):
X-ray Thomson scattering Ultrahigh resolution X-ray free electron laser Density function theory Linear response TDDFT
Related identifiers:
Identical to:
https://www.hzdr.de/publications/Publ-41145
Referenced by:
https://www.hzdr.de/publications/Publ-41320
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License (for files):
Creative Commons Attribution 4.0 International

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Version 1 10.14278/rodare.3650 Mar 26, 2025
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