Dataset Restricted Access
Chava, Phanish; Kateel, Vaishnavi; Watanabe, Kenji; Tanihushi, Takashi; Helm, Manfred; Mikolajick, Thomas; Erbe, Artur
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"> <dc:creator>Chava, Phanish</dc:creator> <dc:creator>Kateel, Vaishnavi</dc:creator> <dc:creator>Watanabe, Kenji</dc:creator> <dc:creator>Tanihushi, Takashi</dc:creator> <dc:creator>Helm, Manfred</dc:creator> <dc:creator>Mikolajick, Thomas</dc:creator> <dc:creator>Erbe, Artur</dc:creator> <dc:date>2024-04-17</dc:date> <dc:description>Transistor measurements</dc:description> <dc:identifier>https://rodare.hzdr.de/record/2813</dc:identifier> <dc:identifier>10.14278/rodare.2813</dc:identifier> <dc:identifier>oai:rodare.hzdr.de:2813</dc:identifier> <dc:language>eng</dc:language> <dc:relation>doi:10.17815/jlsrf-3-159</dc:relation> <dc:relation>url:https://www.hzdr.de/publications/Publ-38985</dc:relation> <dc:relation>url:https://www.hzdr.de/publications/Publ-38872</dc:relation> <dc:relation>doi:10.14278/rodare.2812</dc:relation> <dc:relation>url:https://rodare.hzdr.de/communities/fwi</dc:relation> <dc:relation>url:https://rodare.hzdr.de/communities/ibc</dc:relation> <dc:relation>url:https://rodare.hzdr.de/communities/rodare</dc:relation> <dc:rights>info:eu-repo/semantics/restrictedAccess</dc:rights> <dc:subject>2D-materials</dc:subject> <dc:subject>heterostructures</dc:subject> <dc:subject>transistors</dc:subject> <dc:title>Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions</dc:title> <dc:type>info:eu-repo/semantics/other</dc:type> <dc:type>dataset</dc:type> </oai_dc:dc>
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