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Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions

Chava, Phanish; Kateel, Vaishnavi; Watanabe, Kenji; Tanihushi, Takashi; Helm, Manfred; Mikolajick, Thomas; Erbe, Artur


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  <identifier identifierType="DOI">10.14278/rodare.2813</identifier>
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    <creator>
      <creatorName>Chava, Phanish</creatorName>
      <givenName>Phanish</givenName>
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      <creatorName>Kateel, Vaishnavi</creatorName>
      <givenName>Vaishnavi</givenName>
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    <creator>
      <creatorName>Watanabe, Kenji</creatorName>
      <givenName>Kenji</givenName>
      <familyName>Watanabe</familyName>
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      <affiliation>National Institute for Materials Science: Tsukuba, Ibaraki, JP</affiliation>
    </creator>
    <creator>
      <creatorName>Tanihushi, Takashi</creatorName>
      <givenName>Takashi</givenName>
      <familyName>Tanihushi</familyName>
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      <affiliation>National Institute for Materials Science: Tsukuba, Ibaraki, JP</affiliation>
    </creator>
    <creator>
      <creatorName>Helm, Manfred</creatorName>
      <givenName>Manfred</givenName>
      <familyName>Helm</familyName>
      <affiliation>HZDR</affiliation>
    </creator>
    <creator>
      <creatorName>Mikolajick, Thomas</creatorName>
      <givenName>Thomas</givenName>
      <familyName>Mikolajick</familyName>
      <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0003-3814-0378</nameIdentifier>
      <affiliation>TU Dresden</affiliation>
    </creator>
    <creator>
      <creatorName>Erbe, Artur</creatorName>
      <givenName>Artur</givenName>
      <familyName>Erbe</familyName>
      <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0001-6368-8728</nameIdentifier>
    </creator>
  </creators>
  <titles>
    <title>Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions</title>
  </titles>
  <publisher>Rodare</publisher>
  <publicationYear>2024</publicationYear>
  <subjects>
    <subject>2D-materials</subject>
    <subject>heterostructures</subject>
    <subject>transistors</subject>
  </subjects>
  <dates>
    <date dateType="Issued">2024-04-17</date>
  </dates>
  <language>en</language>
  <resourceType resourceTypeGeneral="Dataset"/>
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  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="Cites">10.17815/jlsrf-3-159</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsIdenticalTo">https://www.hzdr.de/publications/Publ-38985</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsReferencedBy">https://www.hzdr.de/publications/Publ-38872</relatedIdentifier>
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    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://rodare.hzdr.de/communities/fwi</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://rodare.hzdr.de/communities/ibc</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://rodare.hzdr.de/communities/rodare</relatedIdentifier>
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  <rightsList>
    <rights rightsURI="info:eu-repo/semantics/restrictedAccess">Restricted Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">&lt;p&gt;Transistor measurements&lt;/p&gt;</description>
  </descriptions>
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