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Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions

Chava, Phanish; Kateel, Vaishnavi; Watanabe, Kenji; Tanihushi, Takashi; Helm, Manfred; Mikolajick, Thomas; Erbe, Artur


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{
  "abstract": "<p>Transistor measurements</p>", 
  "issued": {
    "date-parts": [
      [
        2024, 
        4, 
        17
      ]
    ]
  }, 
  "publisher": "Rodare", 
  "language": "eng", 
  "DOI": "10.14278/rodare.2813", 
  "id": "2813", 
  "title": "Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions", 
  "author": [
    {
      "family": "Chava, Phanish"
    }, 
    {
      "family": "Kateel, Vaishnavi"
    }, 
    {
      "family": "Watanabe, Kenji"
    }, 
    {
      "family": "Tanihushi, Takashi"
    }, 
    {
      "family": "Helm, Manfred"
    }, 
    {
      "family": "Mikolajick, Thomas"
    }, 
    {
      "family": "Erbe, Artur"
    }
  ], 
  "type": "dataset"
}
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