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Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions

Chava, Phanish; Kateel, Vaishnavi; Watanabe, Kenji; Tanihushi, Takashi; Helm, Manfred; Mikolajick, Thomas; Erbe, Artur


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{
  "@id": "https://doi.org/10.14278/rodare.2813", 
  "identifier": "https://doi.org/10.14278/rodare.2813", 
  "url": "https://rodare.hzdr.de/record/2813", 
  "datePublished": "2024-04-17", 
  "keywords": [
    "2D-materials", 
    "heterostructures", 
    "transistors"
  ], 
  "sameAs": [
    "https://www.hzdr.de/publications/Publ-38985"
  ], 
  "name": "Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions", 
  "citation": [
    {
      "@type": "CreativeWork", 
      "@id": "https://doi.org/10.17815/jlsrf-3-159"
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  "inLanguage": {
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    "alternateName": "eng", 
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  "description": "<p>Transistor measurements</p>", 
  "@type": "Dataset", 
  "creator": [
    {
      "name": "Chava, Phanish", 
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      "affiliation": "HZDR", 
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    }, 
    {
      "name": "Kateel, Vaishnavi", 
      "affiliation": "HZDR", 
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    {
      "name": "Watanabe, Kenji", 
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      "affiliation": "National Institute for Materials Science: Tsukuba, Ibaraki, JP", 
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    }, 
    {
      "name": "Tanihushi, Takashi", 
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      "affiliation": "National Institute for Materials Science: Tsukuba, Ibaraki, JP", 
      "@type": "Person"
    }, 
    {
      "name": "Helm, Manfred", 
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    {
      "name": "Mikolajick, Thomas", 
      "@id": "https://orcid.org/0000-0003-3814-0378", 
      "affiliation": "TU Dresden", 
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    }, 
    {
      "name": "Erbe, Artur", 
      "@id": "https://orcid.org/0000-0001-6368-8728", 
      "@type": "Person"
    }
  ]
}
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