June 7, 2022 Dataset Open Access

Zhdanov, Maksim; Ganeva, Marina; Randolph, Lisa; Kluge, Thomas; Hoffmann, Nico

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{
  "keywords": [
    "GISAXS", 
    "Inverse problems"
  ], 
  "identifier": "https://doi.org/10.14278/rodare.1687", 
  "datePublished": "2022-06-07", 
  "@id": "https://doi.org/10.14278/rodare.1687", 
  "url": "https://rodare.hzdr.de/record/1687", 
  "creator": [
    {
      "affiliation": "Helmholtz-Zentrum Dresden Rossendorf", 
      "@type": "Person", 
      "name": "Zhdanov, Maksim", 
      "@id": "https://orcid.org/0000-0003-3832-2577"
    }, 
    {
      "affiliation": "Forschungszentrum J\u00fclich GmbH, J\u00fclich Centre for Neutron Science (JCNS) at Heinz Maier-Leibnitz Zentrum (MLZ), Garching, Germany", 
      "@type": "Person", 
      "name": "Ganeva, Marina"
    }, 
    {
      "affiliation": "Department Physik, Universit\u00e4t Siegen, Siegen, Germany", 
      "@type": "Person", 
      "name": "Randolph, Lisa"
    }, 
    {
      "affiliation": "Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany", 
      "@type": "Person", 
      "name": "Kluge, Thomas"
    }, 
    {
      "affiliation": "Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany", 
      "@type": "Person", 
      "name": "Hoffmann, Nico"
    }
  ], 
  "description": "<p>The dataset consists of 50000 X-ray diffraction patterns simulated by BornAgain [1] software. For each simulation, a multilayer sample model of the following structure was used: air, tantalum oxide, silicon dioxide, and substrate. Parameters of each layer but tantalum oxide were kept fixed. Hence, each diffraction pattern depends on the parameters of the tantalum oxide layer: real and complex part of refractive index, thickness, roughness, Hurst parameter, and correlation length. Each simulation output is stored in an h5py file consisting of 1) diffraction image as a NumPy array of shape [1024, 512]; 2) sample parameters as a NumPy array with 6 elements. For further details regarding simulation, see https://github.com/maxxxzdn/gisaxs-reconstruction/simulation/simulation.</p>\n\n<p>[1] Pospelov, G., Van Herck, W., Burle, J., Carmona Loaiza, J.M., Durniak, C., Fisher, J., Ganeva, M., Yurov, D., &amp; Wuttke, J. (2020). BornAgain: software for simulating and fitting grazing-incidence small-angle scattering.&nbsp;<em>Journal of Applied Crystallography, 53</em>, 262 - 276.</p>", 
  "name": "Dataset for Inversion of GISAXS data (1 layer)", 
  "license": "https://creativecommons.org/licenses/by/4.0/legalcode", 
  "sameAs": [
    "https://www.hzdr.de/publications/Publ-34769"
  ], 
  "@type": "Dataset", 
  "version": "0.1", 
  "@context": "https://schema.org/", 
  "distribution": [
    {
      "fileFormat": "zip", 
      "@type": "DataDownload", 
      "contentUrl": "https://rodare.hzdr.de/api/files/e67cfc74-53d0-4c1e-8f1b-f520c265e644/layer_1.zip"
    }
  ]
}