June 7, 2022 Dataset Open Access

Zhdanov, Maksim; Ganeva, Marina; Randolph, Lisa; Kluge, Thomas; Hoffmann, Nico

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  <identifier identifierType="DOI">10.14278/rodare.1687</identifier>
  <creators>
    <creator>
      <creatorName>Zhdanov, Maksim</creatorName>
      <givenName>Maksim</givenName>
      <familyName>Zhdanov</familyName>
      <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0003-3832-2577</nameIdentifier>
      <affiliation>Helmholtz-Zentrum Dresden Rossendorf</affiliation>
    </creator>
    <creator>
      <creatorName>Ganeva, Marina</creatorName>
      <givenName>Marina</givenName>
      <familyName>Ganeva</familyName>
      <affiliation>Forschungszentrum Jülich GmbH, Jülich Centre for Neutron Science (JCNS) at Heinz Maier-Leibnitz Zentrum (MLZ), Garching, Germany</affiliation>
    </creator>
    <creator>
      <creatorName>Randolph, Lisa</creatorName>
      <givenName>Lisa</givenName>
      <familyName>Randolph</familyName>
      <affiliation>Department Physik, Universität Siegen, Siegen, Germany</affiliation>
    </creator>
    <creator>
      <creatorName>Kluge, Thomas</creatorName>
      <givenName>Thomas</givenName>
      <familyName>Kluge</familyName>
      <affiliation>Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany</affiliation>
    </creator>
    <creator>
      <creatorName>Hoffmann, Nico</creatorName>
      <givenName>Nico</givenName>
      <familyName>Hoffmann</familyName>
      <affiliation>Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany</affiliation>
    </creator>
  </creators>
  <titles>
    <title>Dataset for Inversion of GISAXS data (1 layer)</title>
  </titles>
  <publisher>Rodare</publisher>
  <publicationYear>2022</publicationYear>
  <subjects>
    <subject>GISAXS</subject>
    <subject>Inverse problems</subject>
  </subjects>
  <dates>
    <date dateType="Issued">2022-06-07</date>
  </dates>
  <resourceType resourceTypeGeneral="Dataset"/>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://rodare.hzdr.de/record/1687</alternateIdentifier>
  </alternateIdentifiers>
  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsIdenticalTo">https://www.hzdr.de/publications/Publ-34769</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.14278/rodare.1686</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://rodare.hzdr.de/communities/matter</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://rodare.hzdr.de/communities/rodare</relatedIdentifier>
  </relatedIdentifiers>
  <version>0.1</version>
  <rightsList>
    <rights rightsURI="https://creativecommons.org/licenses/by/4.0/legalcode">Creative Commons Attribution 4.0 International</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">&lt;p&gt;The dataset consists of 50000 X-ray diffraction patterns simulated by BornAgain [1] software. For each simulation, a multilayer sample model of the following structure was used: air, tantalum oxide, silicon dioxide, and substrate. Parameters of each layer but tantalum oxide were kept fixed. Hence, each diffraction pattern depends on the parameters of the tantalum oxide layer: real and complex part of refractive index, thickness, roughness, Hurst parameter, and correlation length. Each simulation output is stored in an h5py file consisting of 1) diffraction image as a NumPy array of shape [1024, 512]; 2) sample parameters as a NumPy array with 6 elements. For further details regarding simulation, see https://github.com/maxxxzdn/gisaxs-reconstruction/simulation/simulation.&lt;/p&gt;

&lt;p&gt;[1] Pospelov, G., Van Herck, W., Burle, J., Carmona Loaiza, J.M., Durniak, C., Fisher, J., Ganeva, M., Yurov, D., &amp;amp; Wuttke, J. (2020). BornAgain: software for simulating and fitting grazing-incidence small-angle scattering.&amp;nbsp;&lt;em&gt;Journal of Applied Crystallography, 53&lt;/em&gt;, 262 - 276.&lt;/p&gt;</description>
  </descriptions>
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