Dataset Open Access
Zhdanov, Maksim; Ganeva, Marina; Randolph, Lisa; Kluge, Thomas; Hoffmann, Nico
The dataset consists of 50000 X-ray diffraction patterns simulated by BornAgain [1] software. For each simulation, a multilayer sample model of the following structure was used: air, tantalum oxide, silicon dioxide, and substrate. Parameters of each layer but tantalum oxide were kept fixed. Hence, each diffraction pattern depends on the parameters of the tantalum oxide layer: real and complex part of refractive index, thickness, roughness, Hurst parameter, and correlation length. Each simulation output is stored in an h5py file consisting of 1) diffraction image as a NumPy array of shape [1024, 512]; 2) sample parameters as a NumPy array with 6 elements. For further details regarding simulation, see https://github.com/maxxxzdn/gisaxs-reconstruction/simulation/simulation.
[1] Pospelov, G., Van Herck, W., Burle, J., Carmona Loaiza, J.M., Durniak, C., Fisher, J., Ganeva, M., Yurov, D., & Wuttke, J. (2020). BornAgain: software for simulating and fitting grazing-incidence small-angle scattering. Journal of Applied Crystallography, 53, 262 - 276.
Name | Size | |
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layer_1.zip
md5:e0ec297be4e0378a32da2d8719579f1d |
993.3 MB | Download |
All versions | This version | |
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Views | 621 | 621 |
Downloads | 270 | 270 |
Data volume | 268.2 GB | 268.2 GB |
Unique views | 273 | 273 |
Unique downloads | 27 | 27 |