Dataset Open Access

Data publication: In-situ GISAXS observation of ion-induced nanoscale pattern formation on crystalline Ge(001) in the reverse epitaxy regime

Erb, Denise; Myint, Peco; Evans-Lutterodt, Kenneth; Ludwig, Karl; Facsko, Stefan

experimental raw data: in-situ Grazing Incidence Small Angle X-ray Scattering (GISAXS), ex-situ Atomic Force Microscopy (AFM); simulated raw data: surface topography (RIDO)

Files (4.6 GB)
Name Size
AFM.zip
md5:75cd64e24346c67cd0efe155a9a9d9c7
22.8 MB Download
GISAXS.zip
md5:6c61c80e7ff0247b7de65a5ac580cc2e
1.6 GB Download
RIDO.zip
md5:19811b9ac03a7acc818be6b931b8a797
2.9 GB Download
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